The Opportunity of Anti-ferroelectrics in FeFET for Emerging Non-Volatile Memory Applications
- Year
- 2025
- Author
- Hyojun Choi, Giuk Kim, Hunbeom Shin, Yunseok Nam, Sanghun Jeon, Kwangsoo Kim, Suhwan Lim, Jongho Woo, Wanki Kim, Daewon Ha, Jinho Ahn
- Conference
- IEEE International Reliability Physics Symposium (IRPS)
- Status
- Accepted
- Link
- http://doi.org/10.1109/IRPS48204.2025.10982822 435회 연결
