Decoupling and Quantifying Polarization and Trap Charges in MIFIS FeNAND: Insights into Charge Dynamics and Reliability 

Year

2025 

Author

Hongrae Joh, Hyunjun Kang, Junhyeok Kwak, Giuk Kim, Hyojun Choi, Hoon Kim, Sanghyun Park, Kwangyou Seo, Kwangsoo Kim, Wanki Kim, Daewon Ha, Jinho Ahn, Sanghun Jeon 

Conference

2025 IEEE International Electron Devices Meeting (IEDM) 

Status

Accepted