Oxide Interlayer Engineering in Self-Rectifying Ferroelectric Tunnel Junctions: Oxygen Reservoir Effect on Interface Passivation and Memory Reliability

Author

Paul Gallegos, Sohyeon An, Seungyeon Chang, Jae-hyeon Cho, Hunbeom Shin, Seokwon Lee, Sang-hee Ko Park, Mincheol Shin, Jinho Ahn, Sanghun Jeon

Journal

ACS Applied Electronic Materials

Year

2026