Interface engineering of oxidized Mo electrodes for imprint stability and enhanced endurance in hafnia-based ferroelectric devices

Author

Junghyeon Hwang, Chaeheon Kim, Geonhyeong Kang, Yongsu Kim, Jinho Ahn, Sanghun Jeon

Journal

Journal of Materials Chemistry C

Year

2025

Link

http://10.1039/D5TC02605A 769회 연결