Band Engineering of Gate Interlayer for Low-voltage Operation and Enhanced Reliability in Gate-injection Type FeFETs

Author

Hoon Kim, Giuk Kim, Hyojun Choi, Hongrae Joh, Hyunjun Kang, Sanghyun Park, Kwangyou Seo, Kwangsoo Kim, Wanki Kim, Daewon Ha, Jinho Ahn, Sanghun Jeon

Journal

IEEE Electron Device Letters

Year

2026

Link

https://doi.org/10.1109/LED.2026.3665112 554회 연결