The Effect of Ferroelectric/Dielectric Capacitance Ratio on Short-Term Retention Characteristics of MFMIS FeFET

Author

Junghyeon Hwang, Giuk Kim, Hongrae Joh, Jinho Ahn, Sanghun Jeon

Journal

IEEE Journal of the Electron Devices Society

Status

Accepted

Year

2024

Link

https://doi.org/10.1109/JEDS.2024.3485869 1013회 연결