Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal–Ferroelectric–Insulator–Si (MFIS) FeFET

Author

Giuk Kim, Hyojun Choi, Sangho Lee, Hunbeom Shin, Sangmok Lee, Yunseok Nam, Hyunjun Kang, Seokjoong Shin, Hoon Kim, Youngjin Lim, Kang Kim, Il-Kwon Oh, Sang-Hee Ko Park, Jinho Ahn, Sanghun Jeon

Journal

IEEE Transactions on Electron Devices

Status

Accepted

Year

2024

Link

https://doi.org/10.1109/TED.2024.3442163 870회 연결