In situ grazing incidence synchrotron x-ray diffraction studies on the wakeup effect in ferroelectric Hf0. 5Zr0. 5O2 thin films
Author
Dante Ahn, Gopinathan Anoop, Jun Young Lee, Youngin Goh, WooJun Seol, Sanjith Unithrattil, Shibnath Samanta, Je Oh Choi, Seong Min Park, Su Yong Lee, Hyeon Jun Lee, Jong Bae Park, Sanghun Jeon, Ji Young Jo