The Influence of Hydrogen on Defects of In–Ga–Zn–O Semiconductor Thin-Film Transistors With Atomic-Layer Deposition of Al2O3

Author

Taeho Kim, Yunyong Nam, Jihyun Hur, Sang-Hee Ko Park, Sanghun Jeon

Journal

IEEE Electron Device Letters

Vol

37

Page

1131-1134

Year

2016

Link

https://ieeexplore.ieee.org/abstract/document/7544475 684회 연결