Impact of fast transient charging and ambient on mobility of WS2 field-effect transistor

Author

Junghak Park, Hyunsuk Woo, Sanghun Jeon

Journal

Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Vol

35

Page

050601

Year

2017

Link

https://avs.scitation.org/doi/full/10.1116/1.4989781 813회 연결