Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor

Author

Youngin Goh, Sanghun Jeon

Journal

IEEE Transactions on Electron Devices

Vol

65

Page

3264-3268

Year

2018

Link

https://ieeexplore.ieee.org/abstract/document/8402249 668회 연결