Quantitative analysis of charge trapping and classification of sub-gap states in MoS2 TFT by pulse I–V method

Author

Junghak Park, Ji-Hyun Hur, Sanghun Jeon

Journal

Nanotechnology

Vol

29

Page

175704

Year

2018

Link

https://iopscience.iop.org/article/10.1088/1361-6528/aa9cc6/meta 891회 연결