Effects of iCVD organic passivation in oxide thin-film transistors under repetitive bending stress for electrical and mechanical stability

Author

Taeseung Jung, Sanghun Jeon

Journal

Journal of Vacuum Science & Technology B

Vol

40

Page

042201

Year

2022

Link

https://avs.scitation.org/doi/full/10.1116/6.0001800 808회 연결