Relatively Low-k Ferroelectric Nonvolatile Memory Using Fast Ramping Fast Cooling Annealing Process

Author

Junghyeon Hwang, Minki Kim, Minhyun Jung, Taeho Kim, Youngin Goh, Yongsun Lee, Sanghun Jeon

Journal

IEEE Transactions on Electron Devices

Vol

69

Page

3439-3445

Year

2022

Link

https://ieeexplore.ieee.org/abstract/document/9762528 1396회 연결