Ultrafast (50 ns) ID–VG Analysis on Oxide ThinFilm Transistors With Morphotropic Phase Boundary State High-κ Gate Insulator

Author

Taeseung Jung, Sooji Nam, and Sanghun Jeon

Journal

IEEE Transactions on Electron Devices

Status

Accepted

Year

2024

Link

https://ieeexplore.ieee.org/abstract/document/10478833 977회 연결