Design Guidelines of Hafnia Ferroelectrics and Gate-Stack for Multilevel-Cell FeFET

Author

Sangho Lee, Giuk Kim, Youngkyu Lee, Hunbeom Shin, Youngseok Jeong, Lingwei Zhang, Seong-Ook Jung, Sanghun Jeon

Journal

IEEE Transactions on Electron Devices

Status

Accepted

Year

2024

Link

https://doi.org/10.1109/TED.2024.3355873 1183회 연결