Positive Interaction Between Charge Trapping and Polarization Switching in Metal-Interlayer-Ferroelectric-Interlayer-Silicon (MIFIS) Ferroelectric Field-Effect Transistor

Author

Hyojun Choi, Giuk Kim, Sangho Lee, Hunbeom Shin, Youngjin Lim, Kang Kim, Do-Hyung Kim, Il-Kwon Oh, Sang-Hee Ko Park, Jinho Ahn, Sanghun Jeon

Journal

IEEE Electron Device Letters

Status

Accepted

Year

2024

Link

https://doi.org/10.1109/LED.2024.3466211 865회 연결