Damage mitigation as a strategy to achieve high ferroelectricity and reliability in hafnia for random-access-memory

Author

Junghyeon Hwang, Hunbeom Shin, Chaeheon Kim, Jinho Ahn, Sanghun Jeon

Journal

Journal of Materials Chemistry C

Status

Accepted

Year

2025

Link

https://doi.org/10.1039/d4tc02460e 728회 연결