Imprinted Antiferroelectric with Low Damage Process for High Performance Negative Capacitance NAND Flash Memory

Author

Sangho Lee, Giuk Kim, Yunseok Nam, Yeongseok Jeong, Taeho Kim, Hunbeom Shin, Sangmok Lee, Jinho Ahn, Sanghun Jeon

Journal

IEEE Electron Device Letters

Status

Accepted

Year

2025

Link

https://doi.org/10.1109/LED.2025.3538562 732회 연결