Very high frequency (∼100 MHz) plasma enhanced atomic layer deposition high-κ hafnium zirconium oxide capacitors near morphotropic phase boundary with low current density & high-κ for DRAM technology
- Journal
- Journal of Materials Chemistry C
- Status
- Accepted
- Year
- 2025
- Link
- https://doi.org/10.1039/D4TC04979A 1078회 연결
