Damage mitigation as a strategy to achieve high ferroelectricity and reliability in hafnia for random-access-memory

Author

Junghyeon Hwang, Hunbeom Shin, Chaeheon Kim, Jinho Ahn, Sanghun Jeon

Journal

Journal of Materials Chemistry C

Status

Accepted

Year

2024

Link

https://doi.org/10.1039/D4TC02460E 853회 연결