Engineering Negative Capacitance in Hf0.5Zr0.5O2 for Low-Power and Reliable Charge Trap Flash Memory

Author

Yunseok Nam, Sangho Lee, Yangjin Jung, Kang Kim, Jihye Ok, Jinwook Ha, Heemin Yoon, Mincheol Shin, Sang-Hee Ko Park, Jinho Ahn, Sanghun Jeon

Journal

ACS Applied Materials & Interfaces

Year

2026

Link

https://doi.org/10.1021/acsami.5c18930 691회 연결